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A Proposed Test Path Generation Algorithm based on UML Activity Diagram

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dc.contributor.author Kyaw, Aye Aye
dc.contributor.author Min, Myat Myat
dc.date.accessioned 2019-07-03T03:29:27Z
dc.date.available 2019-07-03T03:29:27Z
dc.date.issued 2015-02-05
dc.identifier.uri http://onlineresource.ucsy.edu.mm/handle/123456789/145
dc.description.abstract oftware testing is an activity of finding defects during execution time for a program so that nondefect software can be got. Software testing plays a vital role in developing software that is free from bugs and defects. Manual test is a cost and time consuming process although it may find many defects in a software application. If the testing process could be automated, the cost of developing software could be reduced obviously within a minimum amount of time. The most critical part of the testing process is generation of test paths. The paper proposes an approach for automatic Model-Based best test path generation. In this approach, all possible test paths are directly generated from XMI (XML Metadata Interchange)filebased on the activity diagram and a test path from these generated test paths is optimized. The proposed system will reduce the processing time, and choose the best test path without dependence on others. en_US
dc.language.iso en en_US
dc.publisher Thirteenth International Conferences on Computer Applications(ICCA 2015) en_US
dc.title A Proposed Test Path Generation Algorithm based on UML Activity Diagram en_US
dc.type Article en_US


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